ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3

Info Box Applies to Machine Learning Applies to Machine Learning Technical Notes

Contents

HistoryEdit

Version	Date	Notes
1.0.0	March 2021	First public release

Building the datasetEdit

Defects generation and acquisitionEdit

Class subdivision and labellingEdit

Soldering regions extractionEdit

Data augmentation with image synthesisEdit

Generative adversarial networksEdit

Progressive GAN implementationEdit

Results validationEdit

T-SNE algorithm results for missing class synthesized images

512 × 512 resolution full images

256 × 256 resolution full images

256 × 256 resolution upper and lower region images