Difference between revisions of "ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3"
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==Useful links== | ==Useful links== | ||
| + | *Tero Karras, Timo Aila, Samuli Laine, Jaakko Lehtinen, [https://arxiv.org/abs/1710.10196 ''Progressive Growing of GANs for Improved Quality, Stability, and Variation''], February 2018. | ||
| + | * Ishaan Gulrajani, Faruk Ahmed, Martin Arjovsky, Vincent Dumoulin, Aaron Courville, [https://arxiv.org/abs/1704.00028 ''Improved Training of Wasserstein GANs''], December 2017. | ||
Revision as of 09:41, 14 April 2021
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Contents
History[edit | edit source]
| Version | Date | Notes |
|---|---|---|
| 1.0.0 | March 2021 | First public release |
Introduction[edit | edit source]
Building the dataset[edit | edit source]
Defects generation and acquisition[edit | edit source]
Class subdivision and labelling[edit | edit source]
Soldering regions extraction[edit | edit source]
Data augmentation with image synthesis[edit | edit source]
Generative adversarial networks[edit | edit source]
Progressive GAN implementation[edit | edit source]
Results validation[edit | edit source]
Useful links[edit | edit source]
- Tero Karras, Timo Aila, Samuli Laine, Jaakko Lehtinen, Progressive Growing of GANs for Improved Quality, Stability, and Variation, February 2018.
- Ishaan Gulrajani, Faruk Ahmed, Martin Arjovsky, Vincent Dumoulin, Aaron Courville, Improved Training of Wasserstein GANs, December 2017.
