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== History ==
The ATE tests the functionalities of the product–also known as device under test (DUT)–by exchanging data over its numerous interfaces. In this case, the DUT integrates some video outputs (namely HDMI, LVDS0, and LVDS1) that consist of differential pairs. These outputs usually drive LCD screens or HDMI monitors. In order to test them, the easiest solution is to connect such displays and to verify that the test images are visualized properly. Even though this approach is straightforward, it is very economically inefficient from the economic standpoint because it is slow and error-prone, as it requires a human operator to visually inspect the displays.
The solution described in this technical note addresses this issue. By implementing an automatic test system, it fully releases the operator from this task. Also, the test is much quicker and much more reliable, as it implements a 100% coverage of the pixels the test frames are composed of.
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