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Data integrity and I/O performance tests (DUL)

Revision as of 09:55, 28 September 2012 by DevWikiAdmin (talk | contribs)

Info Box
Dul-coin.png Applies to DUL

The integrity tests have been performed according to JEDEC standards JESD218A and JESD219 (Solid-State Drive Requirements and Endurance Test Method, Solid-State Drive Endurance Workloads respectively).

Test conditions:

  • room temperature: 25°C
  • software test: vdbench 5.02
  • NAND flash: Samsung K9K8G08U0B-PIBO.

Raw read/writeEdit

Enterprise endurance workloadEdit

TBD