Difference between revisions of "Data integrity and I/O performance tests (DUL)"
DevWikiAdmin (talk | contribs) |
DevWikiAdmin (talk | contribs) (→Raw read/write) |
||
| Line 8: | Line 8: | ||
* software test: vdbench 5.02 | * software test: vdbench 5.02 | ||
* NAND flash: Samsung K9K8G08U0B-PIBO. | * NAND flash: Samsung K9K8G08U0B-PIBO. | ||
| + | ==Raw read/write== | ||
| + | |||
Following links point to the complete test reports. Reports are available in HTML and text file. This file can be processed with [https://blogs.oracle.com/paisit/entry/storage_workload_analysis_tool Sun StorageTek TM Workload Analysis Tool (SWAT)]. For more information about how to get it please refer to: https://blogs.oracle.com/henk/entry/swat_3_02_has_been. | Following links point to the complete test reports. Reports are available in HTML and text file. This file can be processed with [https://blogs.oracle.com/paisit/entry/storage_workload_analysis_tool Sun StorageTek TM Workload Analysis Tool (SWAT)]. For more information about how to get it please refer to: https://blogs.oracle.com/henk/entry/swat_3_02_has_been. | ||
| − | |||
Test reports: | Test reports: | ||
* raw read | * raw read | ||
| Line 17: | Line 18: | ||
** HTML: http://www.dave.eu/download/public/ssd/dul/test/integrity/vdbench/raw/write/summary.html | ** HTML: http://www.dave.eu/download/public/ssd/dul/test/integrity/vdbench/raw/write/summary.html | ||
** text: http://www.dave.eu/download/public/ssd/dul/test/integrity/vdbench/raw/write/swat_mon.txt. | ** text: http://www.dave.eu/download/public/ssd/dul/test/integrity/vdbench/raw/write/swat_mon.txt. | ||
| + | |||
==Enterprise endurance workload== | ==Enterprise endurance workload== | ||
| − | + | TBD | |
| − | |||
| − | |||
Revision as of 06:54, 1 October 2012
| HOME | SOMs | SBCs | ToloMEO Embedded Assistant |  GET A QUOTE
|
 ONLINE HELPDESK
|
| Roadmap | IoT Services | ML/AI services | Embedded Design Services |
Info Box
|
The integrity tests have been performed according to JEDEC standards JESD218A and JESD219 (Solid-State Drive Requirements and Endurance Test Method, Solid-State Drive Endurance Workloads respectively).
Test conditions:
- room temperature: 25°C
- software test: vdbench 5.02
- NAND flash: Samsung K9K8G08U0B-PIBO.
Raw read/write[edit | edit source]
Following links point to the complete test reports. Reports are available in HTML and text file. This file can be processed with Sun StorageTek TM Workload Analysis Tool (SWAT). For more information about how to get it please refer to: https://blogs.oracle.com/henk/entry/swat_3_02_has_been. Test reports:
- raw read
- raw write
Enterprise endurance workload[edit | edit source]
TBD
