User contributions
15 April 2021
File:Dual-stream decoder.png
Dual-stream decoder's model plot
File:Dual-stream encoder.png
Dual-stream encoder's model plot
File:Dual-stream autoencoder.png
Dual-stream autoencoder's model plot
File:Encoder.png
Encoder's model plot
File:Decoder.png
Decoder's model plot
File:Autoencoder.png
Autoencoder's model plot
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+920
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+2,529
14 April 2021
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+10
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+2,481
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+1,941
File:Samples of defects divided by classes.png
Examples of four types of defects.
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+318
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+201
File:Fade-in progression.png
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+14
File:Fade-in progression.png
ProGAN fade-in progression during training.
File:Training progression.png
ProGAN training progression.
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+645
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+736
File:Tombstoning synthesized images.png
Synthesized images for ''tombstoning'' class.
File:Missing synthesized images.png
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+5
File:Missing synthesized images.png
Synthesized images for missing class
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+545
File:Missing upper lower 256x256.png
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+12
File:Missing 256x256.png
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+8
File:Missing 512x512.png
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+8
File:Tombstoning upper lower 256x256.png
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+12
File:Tombstoning upper lower 256x256.png
T-SNE algorithm results for tombstoning class synthesized images. 256 × 256 resolution upper and lower region images.
File:Tombstoning 512x512.png
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+8
File:Tombstoning 512x512.png
T-SNE algorithm results for tombstoning class synthesized images. 512 × 512 resolution full images.
File:Tombstoning 256x256.png
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-10
File:Tombstoning 256x256.png
T-SNE algorithm results for tombstoning class synthesized images. 256 × 256 resolution upper and lower region images.
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+364
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+527
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 2
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-4
File:Missing upper lower 256x256.png
T-SNE algorithm results for missing class synthesized images. 256 × 256 resolution upper and lower region images.
File:Missing 512x512.png
T-SNE algorithm results for missing class synthesized images. 512 × 512 resolution full images.
File:Missing 256x256.png
T-SNE algorithm results for missing class synthesized images. 256 × 256 resolution full images.
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
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+282
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 2
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+22
13 April 2021
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 2
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+18
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 2
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+190
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 2
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+930
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 2
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+89
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 2
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+301
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 2
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+48
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 2
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+13
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 2
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+52
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 2
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-78
ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 2
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+668