ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3
From DAVE Developer's Wiki
| Version
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Date
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Notes
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| 1.0.0
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March 2021
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First public release
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Defects generation and acquisition[edit | edit source]
Class subdivision and labelling[edit | edit source]
Data augmentation with image synthesis[edit | edit source]
Generative adversarial networks[edit | edit source]
Progressive GAN implementation[edit | edit source]
T-SNE algorithm results for missing class synthesized images
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 512 × 512 resolution full images |
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 256 × 256 resolution full images |
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 256 × 256 resolution upper and lower region images |
T-SNE algorithm results for tombstoning class synthesized images
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 512 × 512 resolution full images |
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 256 × 256 resolution full images |
|
 256 × 256 resolution upper and lower region images |
- Tero Karras, Timo Aila, Samuli Laine, Jaakko Lehtinen, Progressive Growing of GANs for Improved Quality, Stability, and Variation, February 2018.
- Ishaan Gulrajani, Faruk Ahmed, Martin Arjovsky, Vincent Dumoulin, Aaron Courville, Improved Training of Wasserstein GANs, December 2017.
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