Difference between revisions of "ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3"
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|+ '''T-SNE algorithm results for ''missing'' class synthesized images''' | |+ '''T-SNE algorithm results for ''missing'' class synthesized images''' | ||
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| − | |[[File:Missing 512x512.png|thumb| | + | |[[File:Missing 512x512.png|thumb|350x350px|512 × 512 resolution ''full'' images]] |
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| − | |[[File:Missing 256x256.png|thumb| | + | |[[File:Missing 256x256.png|thumb|350x350px|256 × 256 resolution ''full'' images]] |
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| − | |[[File:Missing upper lower 256x256.png|thumb| | + | |[[File:Missing upper lower 256x256.png|thumb|350x350px|256 × 256 resolution ''upper'' and ''lower'' region images]] |
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| + | {| style="background:transparent; color:black" border="0" align="center" cellpadding="10px" cellspacing="0px" height="550" valign="bottom" | ||
| + | |- align="center" | ||
| + | |+ '''T-SNE algorithm results for ''tombstoning'' class synthesized images''' | ||
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| + | |[[File:Tombstoning 512x512.png|thumb|350x350px|512 × 512 resolution ''full'' images]] | ||
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| + | |[[File:Tombstoning 256x256.png|thumb|350x350px|256 × 256 resolution ''full'' images]] | ||
| + | | | ||
| + | |[[File:Tombstoning upper lower 256x256.png|thumb|350x350px|256 × 256 resolution ''upper'' and ''lower'' region images]] | ||
| + | |} | ||
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==Useful links== | ==Useful links== | ||
*Tero Karras, Timo Aila, Samuli Laine, Jaakko Lehtinen, [https://arxiv.org/abs/1710.10196 ''Progressive Growing of GANs for Improved Quality, Stability, and Variation''], February 2018. | *Tero Karras, Timo Aila, Samuli Laine, Jaakko Lehtinen, [https://arxiv.org/abs/1710.10196 ''Progressive Growing of GANs for Improved Quality, Stability, and Variation''], February 2018. | ||
* Ishaan Gulrajani, Faruk Ahmed, Martin Arjovsky, Vincent Dumoulin, Aaron Courville, [https://arxiv.org/abs/1704.00028 ''Improved Training of Wasserstein GANs''], December 2017. | * Ishaan Gulrajani, Faruk Ahmed, Martin Arjovsky, Vincent Dumoulin, Aaron Courville, [https://arxiv.org/abs/1704.00028 ''Improved Training of Wasserstein GANs''], December 2017. | ||
Revision as of 09:54, 14 April 2021
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Contents
History[edit | edit source]
| Version | Date | Notes |
|---|---|---|
| 1.0.0 | March 2021 | First public release |
Introduction[edit | edit source]
Building the dataset[edit | edit source]
Defects generation and acquisition[edit | edit source]
Class subdivision and labelling[edit | edit source]
Soldering regions extraction[edit | edit source]
Data augmentation with image synthesis[edit | edit source]
Generative adversarial networks[edit | edit source]
Progressive GAN implementation[edit | edit source]
Results validation[edit | edit source]
Useful links[edit | edit source]
- Tero Karras, Timo Aila, Samuli Laine, Jaakko Lehtinen, Progressive Growing of GANs for Improved Quality, Stability, and Variation, February 2018.
- Ishaan Gulrajani, Faruk Ahmed, Martin Arjovsky, Vincent Dumoulin, Aaron Courville, Improved Training of Wasserstein GANs, December 2017.
