ML-TN-003 — AI at the edge: visual inspection of assembled PCBs for defect detection — Part 3

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Applies to Machine Learning

Applies to Machine Learning Technical Notes

Contents

1 History
2 Introduction
3 Building the dataset
4 Data augmentation with image synthesis
- 4.1 Generative adversarial networks
- 4.2 Progressive GAN implementation
5 Results validation
6 Useful links

History[edit | edit source]

Version	Date	Notes
1.0.0	March 2021	First public release

Introduction[edit | edit source]

Building the dataset[edit | edit source]

Defects generation and acquisition[edit | edit source]

Class subdivision and labelling[edit | edit source]

Soldering regions extraction[edit | edit source]

Data augmentation with image synthesis[edit | edit source]

Generative adversarial networks[edit | edit source]

Progressive GAN implementation[edit | edit source]

Results validation[edit | edit source]

Useful links[edit | edit source]

HOME	SOMs	SBCs	ToloMEO Embedded Assistant	GET A QUOTE	ONLINE HELPDESK
	Roadmap		IoT Services			ML/AI services	Embedded Design Services

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