Changes

With respect to the NOR flash memories, NAND devices are known to be quite challenging with regard to the reliability. This is especially true when the NAND flash is used as the boot device. Several techniques such as wear leveling and bad block management have to be implemented to achieve an acceptable reliability.

This document describes some details provides information about the NAND devicemanagement, in order to handle it properly when it is used as the boot device on NXP i.MX6-based products.

Even though the examples example shown here refers to an i.MX6SoloX board, the approach is substantially the same across all the i.MX6 family.