Bureaucrats, dave_user, Administrators
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* periodic reading of I2C RTC (Maxim DS3232M)
* periodic reading of Zynq's ADCs
* periodic reading of voltage/current probe (Texas Instruments INA226) connected to the SOM's power rail[[BORA SOM/BELK-L/Pheripherals/Power meter| using the integrated power meter on the evaluation kit]]
* one instance of memtester, exercising 50 MByte of SDRAM
* endless loop of writing/reading/verifying operations on microSD card
*periodic reading of I2C RTC (Maxim DS3232M)
*periodic reading of Zynq's ADCs
*periodic reading of voltage/current probe (Texas Instruments INA226) connected to the SOM's power rail[[BORA SOM/BELK-L/Pheripherals/Power meter| using the integrated power meter on the evaluation kit]]
*one instance of [http://pyropus.ca/software/memtester/ <code>memtester</code>], exercising 50 MByte of SDRAM
*endless loop of writing/reading/verifying operations on microSD card
*periodic reading of I2C remote temperature sensor (Texas Instruments TMP421)
*endless loop of writing/reading/verifying operations on memory stick connected to the USB port.
=====Results=====
*Tamb: temperature of the ambient surrounding the DUT
*periodic reading of I2C RTC (Maxim DS3232M)
*periodic reading of Zynq's ADCs
*periodic reading of voltage/current probe (Texas Instruments INA226) connected to the SOM's power rail[[BORA SOM/BELK-L/Pheripherals/Power meter| using the integrated power meter on the evaluation kit]]
*one instance of [http://pyropus.ca/software/memtester/ <code>memtester</code>], exercising 50 MByte of SDRAM
*endless loop of writing/reading/verifying operations on microSD card
*periodic reading of I2C remote temperature sensor (TExas Instruments TMP421)
*endless loop of writing/reading/verifying operations on memory stick connected to USB port.
=====Results=====
*Tamb: temperature of the ambient surrounding the DUT
*periodic reading of I2C RTC (Maxim DS3232M)
*periodic reading of Zynq's ADCs
*periodic reading of voltage/current probe (Texas Instruments INA226) connected to the SOM's power rail[[BORA SOM/BELK-L/Pheripherals/Power meter| using the integrated power meter on the evaluation kit]]
*one instance of [http://pyropus.ca/software/memtester/ <code>memtester</code>], exercising 50 MByte of SDRAM
*endless loop of writing/reading/verifying operations on microSD card
*endless loop of writing/reading/verifying operations on memory stick connected to the USB port
*endless loop of writing/reading/verifying operations on NAND flash memory.
====Results====
*Tamb: temperature of the ambient surrounding the DUT
[1] In spite of the use of heat sink, this value exceeds maximum valued declared by the manufacturer. This is acceptable in case of stress tests, where it is possible that parts of the DUT get damaged.
[[Category:BORA]]