Bureaucrats, dave_user, Administrators
4,650
edits
Changes
→Introduction
|}
==Introduction==
In many cases, embedded systems that are based on Application Processors such as the NXP i.MX6 make use of read/write file systems. In turn, these file systems use non-volatile flash memories technologies integrated into several different devices (NOR flashes, raw NAND flashes, eMMC's, etc.).
By nature, these components are subject to several issues that need to be handled properly. If not, this can affect negatively their performance in terms of reliability and/or lifetime.
This Technical Note deals with the use of read/write file systems in combination with such memories.
==Wear-out==
One of the most important factors to take into account is wear-out. Simply put, this is a degradation of the memory device due to repeated erasing/writing cycles aka P/E cycles resulting a limited lifetime.
