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Thermal tests and measurements (SBCX)

4 bytes added, 12:36, 11 October 2016
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[1] Even if the software load is the same for all of the test beds, overall and SOM power consumptions may differ accross across the test beds. This is due to the silicon static power consumption that is a function of the temperature itself. 
==Useful links==
*[[Power management (Axel)]]
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